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1

Self-Organized Hexagonal Patterns of Independent Magnetic Nanodots

T. Bobek, N. Mikuszeit, J. Camarero, S. Kyrsta, L. Yang, M. Á. Niño, C. Hofer, L. Gridneva, D. Arvanitis, R. Miranda, J. J. de Miguel, C. Teichert, H. Kurz

Journal:

Advanced Materials

Year:

2007

Language:

english

File:

PDF, 359 KB

english, 2007

2

Strength degradation mechanisms in h-BN/NiAl coated sapphire fibres with a reactive Hf or Y interlayer

D.E. Hajas, S. Kyrsta, S. Richter, J. Mayer, J.M. Schneider

Journal:

Materials Science and Engineering: A

Year:

2008

Language:

english

File:

PDF, 1.46 MB

english, 2008

3

Structure of the Ge–Sb–Te phase-change materials studied by theory and experiment

Zhimei Sun, Stepan Kyrsta, Denis Music, Rajeev Ahuja, Jochen M. Schneider

Journal:

Solid State Communications

Year:

2007

Language:

english

File:

PDF, 588 KB

english, 2007

4

Sputter deposition and film characterization of NiAl on sapphire fibres

K Reichert, C Martı́nez, S Kyrsta, R Cremer, D Neuschütz

Journal:

Year:

2003

Language:

english

File:

PDF, 294 KB

english, 2003

5

Application of argon r.f. plasma etching for the removal of oxidic scales on ULC steels

C. Martínez, S. Kyrsta, R. Cremer, D. Neuschütz

Journal:

Surface and Interface Analysis

Year:

2002

Language:

english

File:

PDF, 158 KB

english, 2002

6

Influence of the composition of BCN films deposited by reactive magnetron sputtering on their properties

C. Martínez, S. Kyrsta, R. Cremer, D. Neuschütz

Journal:

Analytical and Bioanalytical Chemistry

Year:

2002

Language:

english

File:

PDF, 617 KB

english, 2002

7

Depth Profile Analysis on the Nanometer Scale by a Combination of Electron Probe Microanalysis (EPMA) and Focused Ion Beam Specimen Preparation (FIB)

Silvia Richter, Matthias Bückins, Anke Aretz, Stepan Kyrsta, Michael Spähn, Joachim Mayer

Journal:

Microchimica Acta

Year:

2004

Language:

english

File:

PDF, 194 KB

english, 2004

8

A New Method to Examine Interfacial Reactions of a Multilayered System NiAl–Hf–hBN on a Sapphire Fibre

Silvia Richter, Stepan Kyrsta, Jochen Schneider, David Hajas, Joachim Mayer

Journal:

Microchimica Acta

Year:

2006

Language:

english

File:

PDF, 291 KB

english, 2006

9

Deposition and characterization of Ge–Sb–Te layers for applications in optical data storage

S Kyrsta, R Cremer, D Neuschütz, M Laurenzis, P Haring Bolivar, H Kurz

Journal:

Applied Surface Science

Year:

2001

Language:

english

File:

PDF, 243 KB

english, 2001

10

Effect of a BN interlayer on the tensile strength of NiAl coated sapphire fibers

David E. Hajas, Stepan Kyrsta, Jochen M. Schneider

Journal:

Scripta Materialia

Year:

2006

Language:

english

File:

PDF, 253 KB

english, 2006

11

Characterization of Ge–Sb–Te thin films deposited using a composition-spread approach

Stepan Kyrsta, Rainer Cremer, Dieter Neuschütz, Martin Laurenzis, Peter Haring Bolivar, Heinrich Kurz

Journal:

Thin Solid Films

Year:

2001

Language:

english

File:

PDF, 1.10 MB

english, 2001

12

Ion-induced formation of regular nanostructures on amorphous GaSb surfaces

Facsko, S., Bobek, T., Kurz, H., Dekorsy, T., Kyrsta, S., Cremer, R.

Journal:

Applied Physics Letters

Year:

2002

Language:

english

File:

PDF, 383 KB

english, 2002

13

Examination of Interfacial Reactions of a NiAl-Hf-hBN System on a Sapphire Fibre by a Combination of EPMA and FIB Specimen Preparation

Richter, S, Kyrsta, S, Hajas, D, Schneider, J, Mayer, J

Journal:

Microscopy and Microanalysis

Year:

2005

Language:

english

File:

PDF, 501 KB

english, 2005

14

SPIE Proceedings [SPIE Symposium on Integrated Optics - San Jose, CA (Saturday 20 January 2001)] Combinatorial and Composition Spread Techniques in Materials and Device Development II - Ge-Sb-Te system for rewritable optical data storage by a composition-spread approach

Cremer, Rainer, Kyrsta, Stepan, Neuschuetz, Dieter, Laurenzis, Martin, Bolivar, Peter H., Kurz, Heinrich, Jabbour, Ghassan E., Koinuma, Hideomi

Year:

2001

Language:

english

File:

PDF, 591 KB

english, 2001

15

Chemical characterization of optical data storage materials by EPMA

Richter, S., Bückins, M., Kyrsta, S., Cremer, R.

Journal:

Microscopy and Microanalysis

Year:

2002

Language:

english

File:

PDF, 112 KB

english, 2002

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